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| 01505nam a22004095i 4500 |
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| 001 | 23236 |
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| 003 | CONS |
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| 005 | 20131022134217.0 |
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| 007 | cr nn 008mamaa |
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| 008 | 131022s2014 xxu| s |||| 0|eng d |
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| 020 | | . |
‡a9781461479093
‡9978-1-4614-7909-3 |
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| 024 | 7 | . |
‡a10.1007/978-1-4614-7909-3
‡2doi |
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| 035 | | . |
‡a(DE-He213)978-1-4614-7909-3 |
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| 050 | | 4. |
‡aTK7888.4 |
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| 072 | | 7. |
‡aTJFC
‡2bicssc |
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| 072 | | 7. |
‡aTEC008010
‡2bisacsh |
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| 100 | 1 | . |
‡aGrasser, Tibor.
‡eeditor. |
|---|
| 245 | 1 | 0. |
‡aBias Temperature Instability for Devices and Circuits
‡h[electronic resource] /
‡cedited by Tibor Grasser. |
|---|
| 264 | | 1. |
‡aNew York, NY :
‡bSpringer New York :
‡bImprint: Springer,
‡c2014. |
|---|
| 300 | | . |
‡aXI, 810 p. 601 illus., 318 illus. in color.
‡bonline resource. |
|---|
| 336 | | . |
‡atext
‡btxt
‡2rdacontent |
|---|
| 337 | | . |
‡acomputer
‡bc
‡2rdamedia |
|---|
| 338 | | . |
‡aonline resource
‡bcr
‡2rdacarrier |
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| 347 | | . |
‡atext file
‡bPDF
‡2rda |
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| 650 | | 0. |
‡aEngineering. |
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| 650 | | 0. |
‡aSystem safety. |
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| 650 | | 0. |
‡aElectronics. |
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| 650 | | 0. |
‡aSystems engineering. |
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| 650 | 1 | 4. |
‡aEngineering. |
|---|
| 650 | 2 | 4. |
‡aCircuits and Systems. |
|---|
| 650 | 2 | 4. |
‡aSemiconductors. |
|---|
| 650 | 2 | 4. |
‡aElectronics and Microelectronics, Instrumentation. |
|---|
| 650 | 2 | 4. |
‡aQuality Control, Reliability, Safety and Risk. |
|---|
| 710 | 2 | . |
‡aSpringerLink (Online service) |
|---|
| 773 | 0 | . |
‡tSpringer eBooks |
|---|
| 776 | 0 | 8. |
‡iPrinted edition:
‡z9781461479086 |
|---|
| 856 | 4 | 0. |
‡uhttp://biblioteca.ipicyt.edu.mx:2048/login?url=http://dx.doi.org/10.1007/978-1-4614-7909-3
‡yTexto completo
‡9CONS |
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| 950 | | . |
‡aEngineering (Springer-11647) |
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| 901 | | . |
‡a23236
‡b
‡c23236
‡tbiblio
‡sSystem Local |
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