E-book
Reliability Physics and Engineering [electronic resource] : Time-To-Failure Modeling / by J. W. McPherson.
Record details
- ISBN: 9783319001227
- Physical Description: XVI, 399 p. 171 illus., 124 illus. in color. online resource.
- Edition: 2nd ed. 2013.
- Publisher: Heidelberg : Springer International Publishing : 2013.
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Electronic resources
| Introduction | ||
| Materials and Device Degradation | ||
| From Material/Device Degradation to Time-To-Failure | ||
| Time-To-Failure Modeling | ||
| Gaussian Statistics â An Overview | ||
| Time-To-Failure Statistics | ||
| Failure Rate Modeling | ||
| Accelerated Degradation | ||
| Acceleration Factor Modeling | ||
| Ramp-To-Failure Testing | ||
| Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits Breakdown (TDDB) | ||
| Time-To-Failure Models for Selected Failure Mechanisms In Mechanical Engineering | ||
| Conversion of Dynamical Stresses Into Effective Static Values | ||
| Increasing the Reliability of Device/Product Designs | ||
| Screening | ||
| Heat Generation and Dissipation | ||
| Sampling Plans and Confidence Intervals | ||
| Appendix A: Useful Conversion Factors | ||
| Appendix B: Useful Physical Constants | ||
| Appendix C: Useful Rough Rules-Of-Thumb | ||
| Appendix D: Useful Mathematical Expressions | ||
| Appendix E: Useful Differentials and Definite Integrals | ||
| Appendix F: Free-Energy | ||
| Appendix G: t(1-α/2,ν) Distribution Values | ||
| Appendix H: Ï2(P,ν) Distribution Values | ||
| Index. |
