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Selected papers on speckle metrology / Rajpal S. Sirohi, ed.

Record details

  • ISBN: 0819406392
  • Physical Description: xviii, 668 p. : il. ; 28 cm.
  • Publisher: Bellingham, Washington : SPIE Optica Engineering Press, c1991.

Content descriptions

General Note:
"Una publicación de SPIE-- The International Society for Optical Engineering."
Bibliography, etc. Note:
Incluye bibliografía e índice.
Subject: Holografía interferométrica.

Available copies

  • 1 of 1 copy available at IPICYT.

Holds

  • 0 current holds with 1 total copy.
Show Only Available Copies
Location Call Number / Copy Notes Barcode Shelving Location Status Due Date
Biblioteca Ipicyt TA1555 S4 S5 1991 AVA00482 Coleccion General Available -

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020 . ‡a0819406392
05000. ‡aTA1555 ‡bS4 S5 1991
245 . ‡aSelected papers on speckle metrology / ‡cRajpal S. Sirohi, ed.
260 . ‡aBellingham, Washington : ‡bSPIE Optica Engineering Press, ‡cc1991.
300 . ‡axviii, 668 p. : ‡bil. ; ‡c28 cm.
440 0. ‡aSPIE milestone series ; ‡vv. MS 35
500 . ‡a"Una publicación de SPIE-- The International Society for Optical Engineering."
504 . ‡aIncluye bibliografía e índice.
650 . ‡aHolografía interferométrica.
7001 . ‡aSirohi, R.
7001 . ‡aThompson, Brian J.
710 . ‡aSociety of Photo-optical Instrumentation Engineers.
999 . ‡aTA1555 S4 S5 1991 ‡iAVA00482 ‡lCOL_GRAL ‡tLIBRO
901 . ‡a194 ‡b ‡c194 ‡tbiblio ‡sSystem Local

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