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Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
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- ISBN: 9783540279228
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XXVI, 489 p. 153 illus. online resource. - Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
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| Subject: | Physics Particles (Nuclear physics) Optical materials Physics Solid State Physics and Spectroscopy Optical and Electronic Materials |
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Electronic resources
| LDR | 01540nam a22003975i 4500 | ||
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| 001 | 19154 | ||
| 003 | CONS | ||
| 005 | 20131218193714.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2005 gw | s |||| 0|eng d | ||
| 020 | . | ‡a9783540279228 ‡9978-3-540-27922-8 | |
| 024 | 7 | . | ‡a10.1007/3-540-27922-9 ‡2doi |
| 035 | . | ‡a(DE-He213)978-3-540-27922-8 | |
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| 072 | 7. | ‡aPNFS ‡2bicssc | |
| 072 | 7. | ‡aSCI077000 ‡2bisacsh | |
| 100 | 1 | . | ‡aRein, Stefan. ‡eauthor. |
| 245 | 1 | 0. | ‡aLifetime Spectroscopy ‡h[electronic resource] : ‡bA Method of Defect Characterization in Silicon for Photovoltaic Applications / ‡cby Stefan Rein. |
| 264 | 1. | ‡aBerlin, Heidelberg : ‡bSpringer Berlin Heidelberg, ‡c2005. | |
| 300 | . | ‡aXXVI, 489 p. 153 illus. ‡bonline resource. | |
| 336 | . | ‡atext ‡btxt ‡2rdacontent | |
| 337 | . | ‡acomputer ‡bc ‡2rdamedia | |
| 338 | . | ‡aonline resource ‡bcr ‡2rdacarrier | |
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| 490 | 1 | . | ‡aSpringer Series in Material Science, ‡x0933-033X ; ‡v85 |
| 650 | 0. | ‡aPhysics. | |
| 650 | 0. | ‡aParticles (Nuclear physics). | |
| 650 | 0. | ‡aOptical materials. | |
| 650 | 1 | 4. | ‡aPhysics. |
| 650 | 2 | 4. | ‡aSolid State Physics and Spectroscopy. |
| 650 | 2 | 4. | ‡aOptical and Electronic Materials. |
| 710 | 2 | . | ‡aSpringerLink (Online service) |
| 773 | 0 | . | ‡tSpringer eBooks |
| 776 | 0 | 8. | ‡iPrinted edition: ‡z9783540253037 |
| 830 | 0. | ‡aSpringer Series in Material Science, ‡x0933-033X ; ‡v85 | |
| 856 | 4 | 0. | ‡uhttp://biblioteca.ipicyt.edu.mx:2048/login?url=http://dx.doi.org/10.1007/3-540-27922-9 ‡yTexto completo ‡9CONS |
| 950 | . | ‡aPhysics and Astronomy (Springer-11651) | |
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