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Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings Cover Image E-book E-book

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings

Yeung, Dit-Yan. (editor.). Kwok, James T. (editor.). Fred, Ana. (editor.). Roli, Fabio. (editor.). Ridder, Dick. (editor.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9783540372417
  • Physical Description: electronic
    electronic resource
    access
    remote
    XXI, 939 p. Also available online. online resource.
  • Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.

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Subject: Computer science
Computational complexity
Artificial intelligence
Computer graphics
Computer vision
Optical pattern recognition
Computer Science
Pattern Recognition
Discrete Mathematics in Computer Science
Artificial Intelligence (incl. Robotics)
Computer Graphics
Image Processing and Computer Vision

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