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Design and Verification of Microprocessor Systems for High-Assurance Applications Cover Image E-book E-book

Design and Verification of Microprocessor Systems for High-Assurance Applications [electronic resource] / edited by David S. Hardin.

Hardin, David S. (editor.). SpringerLink (Online service) (Added Author).

Record details

  • ISBN: 9781441915399
  • Physical Description: XIV, 436p. 360 illus., 180 illus. in color. online resource.
  • Publisher: Boston, MA : Springer US, 2010.
Subject: Engineering.
Computer aided design.
System safety.
Systems engineering.
Engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Quality Control, Reliability, Safety and Risk.

Electronic resources


ACL2 and its applications to digital system verification -- Matt Kaufmann and J. Strother Moore
mechanically verified commercial SRT divider -- David M. Russinoff
Use of formal verification at Centaur Technology -- Warren A. Hunt, Jr., Sol Swords, Jared Davis and Anna Slobodova
Designing tunable, verifiable cryptographic hardware using Cryptol -- Sally Browning and Philip Weaver
Verifying pipelines with BAT -- Panagiotis Manolios and Sudarshan K. Srinivasan
Formal verification of partition management for the AAMP7G microprocessor -- Matthew M. Wilding, David A. Greve, Raymond J. Richards and David S. Hardin
Compiling higher order logic by proof -- Konrad Slind, Guodong LI and Scott Owens
Specification and verification of ARM hardware and software -- Anthony C. J. Fox, Michael J. C. Gordon and Magnus O. Myreen
Information security modeling and analysis -- David A. Greve
Modeling and security analysis of a commercial real-time operating system kernel -- Raymond J. Richards
Refinement in the formal verification of the SeL4 microkernel -- Gerwin Klein, Thomas Sewell and Simon Winwood
Specification and checking of software contracts for conditional information flow -- Torben Amtoft, John Hatcliff and Edwin Rodriguez / -- Robby / -- Jonathan Hoag and David Greve
Model checking information flow -- Michael W. Whalen, David A. Greve and Lucas G. Wagner.

Additional Resources