Scanning probe microscopy : atomic scale engineering by forces and currents / Adam S. Foster, Werner A. Hofer.
Record details
- ISBN: 0387400907
- Physical Description: xiv, 281 p. : il. ; 25 cm.
- Publisher: New York, NY : Springer, c2006.
Content descriptions
| Bibliography, etc. Note: | Incluye bibliografía e índice. |
Search for related items by subject
| Subject: | Técnicas de microscopia. Técnicas de superficies. |
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Available copies
- 1 of 1 copy available at IPICYT.
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- 0 current holds with 1 total copy.
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| Location | Call Number / Copy Notes | Barcode | Shelving Location | Status | Due Date |
|---|---|---|---|---|---|
| Biblioteca Ipicyt | QH212.S33 F6 S2 2006 | AVA00451 | Coleccion General | Available | - |
| LDR | 00775cam a20002054500 | ||
|---|---|---|---|
| 001 | 1533 | ||
| 003 | CONS | ||
| 005 | 0110617132448.0 | ||
| 006 | aaaafr 1 | ||
| 007 | ta | ||
| 008 | 080204su 2006nyuaaaafr 1 eng d | ||
| 020 | . | ‡a0387400907 | |
| 050 | 0 | 0. | ‡aQH212.S33 ‡bF6 S2 2006 |
| 100 | 1 | . | ‡aFoster, Adam S., ‡q(Adam Stuar), ‡d1975- |
| 245 | . | ‡aScanning probe microscopy : ‡batomic scale engineering by forces and currents / ‡cAdam S. Foster, Werner A. Hofer. | |
| 260 | . | ‡aNew York, NY : ‡bSpringer, ‡cc2006. | |
| 300 | . | ‡axiv, 281 p. : ‡bil. ; ‡c25 cm. | |
| 440 | 0. | ‡aNanoscience and technology | |
| 504 | . | ‡aIncluye bibliografía e índice. | |
| 650 | . | ‡aTécnicas de microscopia. | |
| 650 | . | ‡aTécnicas de superficies. | |
| 700 | 1 | . | ‡aHofer, Werner A., ‡d1960- |
| 999 | . | ‡aQH212.S33 F6 S2 2006 ‡iAVA00451 ‡lCOL_GRAL ‡tLIBRO | |
| 901 | . | ‡a1533 ‡b ‡c1533 ‡tbiblio ‡sSystem Local | |
