Scanning probe microscopy : atomic scale engineering by forces and currents / Adam S. Foster, Werner A. Hofer.
Record details
- ISBN: 0387400907
- Physical Description: xiv, 281 p. : il. ; 25 cm.
- Publisher: New York, NY : Springer, c2006.
Content descriptions
| Bibliography, etc. Note: | Incluye bibliografía e índice. |
Search for related items by subject
| Subject: | Técnicas de microscopia. Técnicas de superficies. |
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Available copies
- 1 of 1 copy available at IPICYT.
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- 0 current holds with 1 total copy.
Other Formats and Editions
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| Location | Call Number / Copy Notes | Barcode | Shelving Location | Status | Due Date |
|---|---|---|---|---|---|
| Biblioteca Ipicyt | QH212.S33 F6 S2 2006 | AVA00451 | Coleccion General | Available | - |
