Catalog

Planewaves, Pseudopotentials and the LAPW Method

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK

Materials for Nuclear Plants From Safe Design to Residual Life Assessments

Electron Scattering From Atoms, Molecules, Nuclei, and Bulk Matter

Surface and Interface Analysis An Electrochemists Toolbox

Advanced Batteries Materials Science Aspects

Transmission electron microscopy and diffractometry of materials

Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science

Semiconductor Physical Electronics

Nanoscale Transistors Device Physics, Modeling and Simulation