Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition

Sachdev, Manoj. (editor.). Gyvez, José Pineda de. (editor.). SpringerLink (Online service) (Added Author).

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• ISBN: 9780387465470
• Physical Description: electronic
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  XXI, 328 p. online resource.
• Publisher: Boston, MA : Springer US, 2007.

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