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E-book
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Foster, Adam.
(
author.
).
Hofer, Werner.
(
author.
).
SpringerLink (Online service)
(
Added Author
).
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ISBN:
9780387372310
Physical Description:
XIV, 281 p. 116 illus. online resource.
Publisher:
New York, NY :
Springer New York,
2006.
Search for related items by subject
Subject:
Chemistry.
Microscopy.
Molecular structure.
Particles (Nuclear physics).
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Atomic and Molecular Structure and Spectra.
Solid State Physics and Spectroscopy.
Biological Microscopy.
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NanoScience and Technology,
1434-4904
NanoScience and Technology,
1434-4904
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English (2)
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