Scanning Probe Microscopy [electronic resource] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer.

Foster, Adam. (author.). Hofer, Werner. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9780387372310
• Physical Description: XIV, 281 p. 116 illus. online resource.
• Publisher: New York, NY : Springer New York, 2006.

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