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Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents Cover Image

E-book

E-book

Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

Foster, Adam. (author.). Hofer, Werner. (author.). SpringerLink (Online service) (Added Author).

Record details

ISBN: 9780387372310
Physical Description: XIV, 281 p. 116 illus. online resource.
Publisher: New York, NY : Springer New York, 2006.

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Subject:

Chemistry.
Microscopy.
Molecular structure.
Particles (Nuclear physics).
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Atomic and Molecular Structure and Spectra.
Solid State Physics and Spectroscopy.
Biological Microscopy.

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