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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
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- ISBN: 9780387260167
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XII, 202 p. 122 illus. online resource. - Publisher: Boston, MA : Springer US : 2005.
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Subject: | Chemistry Microscopy Nanotechnology Surfaces (Physics) Chemistry Characterization and Evaluation of Materials Nanotechnology Biological Microscopy |
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