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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

Egerton, Ray F. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9780387260167
  • Physical Description: electronic
    electronic resource
    access
    remote
    XII, 202 p. 122 illus. online resource.
  • Publisher: Boston, MA : Springer US : 2005.
Subject: Chemistry
Microscopy
Nanotechnology
Surfaces (Physics)
Chemistry
Characterization and Evaluation of Materials
Nanotechnology
Biological Microscopy
Search Results Showing Item 56 of 151

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