Microelectronic Test Structures for CMOS Technology
Record details
- ISBN: 9781441993779
-
Physical Description:
electronic
electronic resource
access
remote
XXXIV, 374p. 303 illus. digital. - Publisher: New York, NY : Springer New York, 2011.
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Subject: | Engineering Electronics Systems engineering Optical materials Engineering Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Circuits and Systems |