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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

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  • ISBN: 9781441978172
  • Physical Description: electronic
    electronic resource
    access
    remote
    XIII, 108p. 41 illus., 24 illus. in color. digital.
  • Publisher: New York, NY : Springer New York, 2011.
Subject: Microreactors
Chemistry, Physical organic
Materials
Materials Science
Ceramics, Glass, Composites, Natural Methods
Spectroscopy and Microscopy
Physical Chemistry
Structural Materials
Atomic/Molecular Structure and Spectra
Microengineering
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