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E-book
Ellipsometry at the Nanoscale
Losurdo, Maria.
(
editor.
).
Hingerl, Kurt.
(
editor.
).
SpringerLink (Online service)
(
Added Author
).
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ISBN:
9783642339561
Physical Description:
XXIV, 730 p. 423 illus., 106 illus. in color. online resource.
Publisher:
Berlin, Heidelberg :
Springer Berlin Heidelberg :
2013.
Search for related items by subject
Subject:
Engineering.
Nanotechnology.
Surfaces (Physics).
Engineering.
Nanotechnology and Microengineering.
Measurement Science and Instrumentation.
Characterization and Evaluation of Materials.
Nanotechnology.
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