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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Cover Image

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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Tan, Cher Ming. (Author). Li, Wei. (Added Author). Gan, Zhenghao. (Added Author). Hou, Yuejin. (Added Author). SpringerLink (Online service) (Added Author).

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ISBN: 9780857293107
Physical Description: VII, 150p. 99 illus., 10 illus. in color. digital.
Edition: 1.
Publisher: London : Springer London, 2011.

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Subject:

Engineering.
Differential equations, partial.
System safety.
Electronics.
Optical materials.
Engineering.
Quality Control, Reliability, Safety and Risk.
Computational Intelligence.
Electronics and Microelectronics, Instrumentation.
Optical and Electronic Materials.
Partial Differential Equations.

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