Catalog

Record Details

Catalog Search

[ 2 filters applied ]

Back To Results
Showing Item 2 of 2
Embedded Systems: Design, Analysis and Verification 4th IFIP TC 10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 17-19, 2013. Proceedings Cover Image E-book E-book

Embedded Systems: Design, Analysis and Verification 4th IFIP TC 10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 17-19, 2013. Proceedings

Schirner, Gunar. (editor.). Götz, Marcelo. (editor.). Rettberg, Achim. (editor.). Zanella, Mauro C. (editor.). Rammig, Franz J. (editor.). SpringerLink (Online service) (Added Author).

Electronic resources

Texto completo

Back To Results
Showing Item 2 of 2

Additional Resources