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Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes
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- ISBN: 9784431544487
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XI, 125 p. 86 illus., 3 illus. in color. online resource. - Publisher: Tokyo : Springer Japan : 2014.
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Subject: | Physics Engineering Physics Spectroscopy and Microscopy Nanotechnology and Microengineering Machinery and Machine Elements Measurement Science and Instrumentation |
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Showing Item 44 of 157
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