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Electromigration Modeling at Circuit Layout Level Cover Image E-book E-book

Electromigration Modeling at Circuit Layout Level

Tan, Cher Ming. (author.). He, Feifei. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9789814451215
  • Physical Description: electronic
    electronic resource
    access
    remote
    IX, 103 p. 75 illus., 2 illus. in color. online resource.
  • Publisher: Singapore : Springer Singapore : Imprint: Springer, 2013.
Subject: Engineering
System safety
Engineering
Quality Control, Reliability, Safety and Risk
Electronic Circuits and Devices
Atomic, Molecular, Optical and Plasma Physics

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Showing Item 355 of 1870

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