Catalog

Record Details

Catalog Search

[ 2 filters applied ]

◄ Search Results Showing Item 2 of 2
◄ Previous

Electromigration Modeling at Circuit Layout Level

Tan, Cher Ming. (author.). He, Feifei. (author.). SpringerLink (Online service) (Added Author).

Electronic resources

Texto completo

Record details

  • ISBN: 9789814451215
  • Physical Description: electronic
    electronic resource
    access
    remote
    IX, 103 p. 75 illus., 2 illus. in color. online resource.
  • Publisher: Singapore : Springer Singapore : 2013.

Search for related items by subject

Subject: Engineering
System safety
Engineering
Quality Control, Reliability, Safety and Risk
Electronic Circuits and Devices
Atomic, Molecular, Optical and Plasma Physics

Search for related items by series

◄ Search Results Showing Item 2 of 2
◄ Previous

Additional Resources