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Electromigration Modeling at Circuit Layout Level
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- ISBN: 9789814451215
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Physical Description:
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IX, 103 p. 75 illus., 2 illus. in color. online resource. - Publisher: Singapore : Springer Singapore : 2013.
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Subject: | Engineering System safety Engineering Quality Control, Reliability, Safety and Risk Electronic Circuits and Devices Atomic, Molecular, Optical and Plasma Physics |
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