Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Im, Seongil. (author.). Chang, Youn-Gyoung. (author.). Kim, Jae Hoon. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9789400763920
• Physical Description: electronic
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  XI, 101 p. 61 illus. online resource.
• Publisher: Dordrecht : Springer Netherlands : 2013.

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