Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Franco, Jacopo. (author.). Kaczer, Ben. (author.). Groeseneken, Guido. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9789400776630
• Physical Description: electronic
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  XIX, 187 p. 219 illus. online resource.
• Publisher: Dordrecht : Springer Netherlands : 2014.

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