E-book
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Record details
- ISBN: 9789400776630
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electronic
electronic resource
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XIX, 187 p. 219 illus. online resource. - Publisher: Dordrecht : Springer Netherlands : Imprint: Springer, 2014.
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| Subject: | Physics Systems engineering Optical materials Physics Semiconductors Circuits and Systems Optical and Electronic Materials Electronic Circuits and Devices |
