Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Shen, Ruijing. (author.). Tan, Sheldon X.-D. (author.). Yu, Hao. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9781461407881
• Physical Description: electronic
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  XXXI, 305p. 104 illus. online resource.
• Publisher: Boston, MA : Springer US, 2012.

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