E-book
Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Record details
- ISBN: 9781461417491
- Physical Description: XVI, 170 p. 153 illus., 6 illus. in color. online resource.
- Publisher: New York, NY : Springer New York : 2013.
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| Subject: | Engineering. Computer aided design. Systems engineering. Engineering. Circuits and Systems. Computer-Aided Engineering (CAD, CAE) and Design. |
