Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield

Abu-Rahma, Mohamed H. (author.). Anis, Mohab. (author.). SpringerLink (Online service) (Added Author).

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• ISBN: 9781461417491
• Physical Description: electronic
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  XVI, 170 p. 153 illus., 6 illus. in color. online resource.
• Publisher: New York, NY : Springer New York : 2013.

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