E-book
Analog IC Reliability in Nanometer CMOS
Record details
- ISBN: 9781461461630
-
Physical Description:
electronic
electronic resource
access
remote
XVI, 198 p. 95 illus., 27 illus. in color. online resource. - Publisher: New York, NY : Springer New York : Imprint: Springer, 2013.
Search for related items by subject
| Subject: | Engineering Electronics Systems engineering Engineering Circuits and Systems Electronics and Microelectronics, Instrumentation Nanotechnology and Microengineering |
