Catalog

Record Details

Catalog Search


Search Results Showing Item 78 of 145

Helium Ion Microscopy Principles and Applications

Joy, David C. (author.). SpringerLink (Online service) (Added Author).

Electronic resources

Record details

  • ISBN: 9781461486602
  • Physical Description: electronic
    electronic resource
    access
    remote
    VIII, 64 p. 29 illus., 16 illus. in color. online resource.
  • Publisher: New York, NY : Springer New York : 2013.
Subject: Spectroscopy
Nanotechnology
Surfaces (Physics)
Materials Science
Characterization and Evaluation of Materials
Spectroscopy and Microscopy
Spectroscopy/Spectrometry
Nanotechnology
Nanoscale Science and Technology
Search Results Showing Item 78 of 145

Additional Resources