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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces  Cover Image E-book E-book

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces

Kaupp, Gerd. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9783540284727
  • Physical Description: electronic
    electronic resource
    access
    remote
    XII, 292 p. 239 illus. online resource.
  • Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
Subject: Chemistry
Chemistry, Physical organic
Biochemistry
Life sciences
Physical optics
Nanotechnology
Chemistry
Nanotechnology
Applied Optics, Optoelectronics, Optical Devices
Physics and Applied Physics in Engineering
Physical Chemistry
Medical Biochemistry
Life Sciences, general

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