Catalog

Record Details

Catalog Search

[ 2 filters applied ]

Back To Results
Showing Item 7 of 9
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings Cover Image E-book E-book

Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings

Yeung, Dit-Yan. (editor.). Kwok, James T. (editor.). Fred, Ana. (editor.). Roli, Fabio. (editor.). Ridder, Dick. (editor.). SpringerLink (Online service) (Added Author).

Record details

  • ISBN: 9783540372417
  • Physical Description: XXI, 939 p. Also available online. online resource.
  • Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.

Search for related items by subject

Subject: Computer science.
Computational complexity.
Artificial intelligence.
Computer graphics.
Computer vision.
Optical pattern recognition.
Computer Science.
Pattern Recognition.
Discrete Mathematics in Computer Science.
Artificial Intelligence (incl. Robotics).
Computer Graphics.
Image Processing and Computer Vision.

Search for related items by series

Electronic resources

Texto completo

Back To Results
Showing Item 7 of 9

Additional Resources