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Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons Cover Image E-book E-book

Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons

Schubert, Mathias. (author.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9783540447016
  • Physical Description: electronic
    electronic resource
    access
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    XI, 193 p. 77 illus. online resource.
  • Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.

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Subject: Chemistry
Physical optics
Optical materials
Surfaces (Physics)
Chemistry
Surfaces and Interfaces, Thin Films
Optical and Electronic Materials
Applied Optics, Optoelectronics, Optical Devices
Physics and Applied Physics in Engineering

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