E-book
Test and Diagnosis for Small-Delay Defects
Record details
- ISBN: 9781441982971
- Physical Description: XVI, 212p. 114 illus. online resource.
- Publisher: New York, NY : Springer New York, 2012.
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| Subject: | Engineering. Operating systems (Computers). Systems engineering. Engineering. Circuits and Systems. Performance and Reliability. Nanotechnology and Microengineering. |
