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Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices  Cover Image E-book E-book

Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices

Gusev, Evgeni. (editor.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9781402043673
  • Physical Description: XI, 492 p. online resource.
  • Publisher: Dordrecht : Springer Netherlands, 2006.
Subject: Engineering.
Condensed matter.
Electronics.
Engineering.
Electronic and Computer Engineering.
Condensed Matter.
Physics and Applied Physics in Engineering.
Electronics and Microelectronics, Instrumentation.

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