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Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices Cover Image E-book E-book

Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices

Gusev, Evgeni. (editor.). SpringerLink (Online service) (Added Author).

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  • ISBN: 9781402043673
  • Physical Description: electronic
    electronic resource
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    remote
    XI, 492 p. online resource.
  • Publisher: Dordrecht : Springer Netherlands, 2006.

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Subject: Engineering
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