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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
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- ISBN: 9781402030192
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XXXVII, 488 p. online resource. - Publisher: Dordrecht : Springer Netherlands, 2005.
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Subject: | Physics Condensed matter Optical materials Nanotechnology Surfaces (Physics) Physics Condensed Matter Optical and Electronic Materials Nanotechnology Surfaces and Interfaces, Thin Films |
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